![nanoHUB.org - Resources: ECE 695A Lecture 9: NBTI Time Dependence -- Stress Phase: Watch Presentation nanoHUB.org - Resources: ECE 695A Lecture 9: NBTI Time Dependence -- Stress Phase: Watch Presentation](https://nanohub.org/app/site/resources/2013/02/16804/slides/009.04.jpg)
nanoHUB.org - Resources: ECE 695A Lecture 9: NBTI Time Dependence -- Stress Phase: Watch Presentation
![Electron trapping and interface trap generation in drain extended PMOS transistors | Semantic Scholar Electron trapping and interface trap generation in drain extended PMOS transistors | Semantic Scholar](https://d3i71xaburhd42.cloudfront.net/a097b751cf06f5d878a047d02a6fc828d7a0dbb6/2-Figure6-1.png)
Electron trapping and interface trap generation in drain extended PMOS transistors | Semantic Scholar
Effects of interface trap generation and annihilation on the data retention characteristics of flash memory cells
![Effects of interface trap generation and annihilation on the data retention characteristics of flash memory cells | Semantic Scholar Effects of interface trap generation and annihilation on the data retention characteristics of flash memory cells | Semantic Scholar](https://d3i71xaburhd42.cloudfront.net/7547f73d9feb2db8f9e8e52a8b958413b5c21528/2-Figure1-1.png)